Laser systems

 

  • Ti:Sapp Ι

Main beam

Central wavelength: 800 nm

Peak power (max): 45 TW

Pulse energy: up to 1.1 J

Pulse duration (adjustable): 23-80 fs

Repetition rate: 0.5-10 Hz

Probe beam

Central wavelength: 800 nm

Pulse Energy: 10 mJ

Pulse duration (adjustable): 30-100 fs

Repetition rate: 0.5-10 Hz

Synchronized to main beam

 

  • Ti:Sapp II

Central wavelength: 800 nm

Repetition rate: 1 kHz

CEP stabilized

Amplifier

Pulse energy: 1.5 mJ

Pulse duration: 35 fs

Fiber compressor

Pulse energy: 0.8 mJ

Pulse duration: <7 fs

 

  • Nd:YAG I

Pulse duration: 150 ps

Wavelengths: 1064/532/355/266 nm

Pulse energy: 250 mJ @1064 nm

Repetition rate: up to 10 Hz

 

  • Nd:YAG II

Pulse duration: 6 ns

Wavelengths: 1064/532/355/266 nm

Pulse energy: 850 mJ @1064 nm

Repetition rate: 10 Hz

 

Secondary sources

 

  • Interaction of the 45TW laser system with solid targets

Electrons:

Energy: ~1 MeV

Dose: 1 Gy/shot

Repetition: single shots per 5΄

Protons:

Energy: ~2.5 MeV

Repetition rate: single shots per 5΄

 

  • Interaction of the 45TW laser system with gaseous targets

Electrons:

Energy: ~150 MeV monoenergetic

Dose: 0.1 mGy/shot

Repetition rate: up to 1 Hz

Ions:

Energy: up to 10 MeV

Repetition rate: up to 1 Hz

 

  • Interaction of the probe beam of the 45TW laser system with gaseous targets

High Harmonics (λ=800nm):

Photon Energy: up to 29th order (27.6nm)

Repetition rate: up to 10 Hz

 

  • X-Pinch device

Point X-Ray source:

Spectral range: 1 – 10KeV

Duration: <4 ns

Yield: ~60 mJ/shot

Source size: <5 μm

Repetition rate: single shots per 20΄

 

  • Plasma Focus device

EUV (13.5 nm):

Yield: 0.7 J/shot

Duration: ~150 ns

Repetition rate: 0.5 Hz

Neutrons:

Energy: 2.4 MeV

Yield: 4.6×106 neutrons/shot

Repetition rate: 0.5 Hz

 

 

 

 

End-stations

  • High Intensity laser matter interaction station

Chamber diameter: 1.5 m

Vacuum pressure: 10-6 mbar

 

  • Moderate Intensity Laser matter interaction station

Chamber diameter: 0.7 m

Vacuum pressure: 10-6 mbar

 

  • Xpinch station

High spatial resolution X-ray radiography

High spatial resolution X-ray backlighting

Hard X-ray spectroscopy

Study of plasma dynamics produced by solid targets

Study of laboratory astrophysical jets

 

  • Plasma Focus station

Neutron applications

Neutron spectroscopy

γ-ray spectroscopy

Study of plasma dynamics produced by gaseous targets

 

  • Optical probing diagnostics station

Dynamic high spatial resolution shadowgraphy

Dynamic high spatial resolution schlieren photography

Dynamic high spatial resolution interferometry

Dynamic high spatial resolution Fraunhofer diffraction imaging

 

 

  • Dynamic pump-probe acoustic wave analysis on solids

Transient reflectivity dynamic analysis

Whole field interferometry dynamic analysis

 

  • Electronic Speckle Pattern Interferometry (ESPI) system

 

  • Nanometer-scale, white light profilometer
  • Laser matter & plasma simulations station

FEM modeling of laser matter & plasma interactions

PIC simulations of laser plasma interactions​​

Z-Pinch and X-Pinch modeling FEM – MHD

HD/MHD/CFD modeling of plasmas

Solid to plasma phase transition

 

More information at www.cppl.teicrete.gr